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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies

- Process-Aware SRAM Design and Test

von Andrei Pavlov & Manoj Sachdev

148,00 €

The monograph will be dedicated to SRAM (memory) design and test issues in nano-scaled technologies by adapting the cell design and chip design considerations to the growing process variations with associated test issues. Purpose: provide process-aware solutions for SRAM design and test challenges.
- Buch
- 148,00 €
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