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Bücher von Chung-Youb Kim

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  • von Ji-Ho Song & Chung-Youb Kim
    139,00 €

    This book demonstrates fatigue crack growth under random loading graphically. This state-of-the-art monograph introduces an expert system for crack growth predictions, particularly based on crack closure. The system is developed after years of research by the authors by using the Math-type software consisting of 5 parts. This system is unique as it is fundamentally different from previous systems as it focuses on fatigue crack growth predictions based on fatigue crack closure. This book can be a useful guide for practicing engineers, researchers, and students in the fields of mechanical, aerospace, or civil engineering.

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