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Bücher von Eddy Simoen

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  • - Origin, Characterization, Control, and Device Impact
    von Eddy Simoen & Cor Claeys
    158,00 €

    material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

  • - Origin, Characterization, Control, and Device Impact
    von Eddy Simoen & Cor Claeys
    158,00 €

    material science, defect engineering, device processing, defect and device characterization, and device physics and engineering.

  • 14% sparen
    von C. Claeys & Eeddy Simoen
    185,00 €

    This wide-ranging book summarizes the current knowledge of radiation defects in semiconductors, outlining the shortcomings of present experimental and modelling techniques and giving an outlook on future developments. It also provides information on the application of sensors in nuclear power plants.

  • 13% sparen
    - Fundamental and Technological Aspects
    von Eddy Simoen & Cor Claeys
    140,00 - 146,00 €

    The first part of this overview on extended defects in Germanium covers fundamentals, describing crystallographic structure and other physical and electrical properties. The second part treats the extended defects during wafer and device processing.

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