Bücher von Kiyoo Itoh

Written from years of experience with developing memories and low-voltage CMOS circuits, Nanoscale Memory Repair describes yield and reliability issues in terms of mathematics and engineering. Readers will find a detailed explanation of the various yield models and calculations.

A systematic description of microelectronic device design. It also covers process and device issues as well as design issues relating to systems, circuits, devices and processes, such as signal-to-noise and redundancy.