Bücher der Reihe Mathematics in Industry

This book is a collection of papers presented at the last Scientific Computing in Electrical Engineering (SCEE) Conference, held in Sicily, in 2004. The series of SCEE conferences aims at addressing mathematical problems which have a relevancy to industry.

Over the past 40 years, diagnostic medical imaging has undergone remarkable advancements in CT, MRI, and ultrasound technology. Today, the field is experiencing a major paradigm shift, thanks to significant and rapid progress in deep learning techniques. As a result, numerous innovative AI-based programs have been developed to improve image quality and enhance clinical workflows, leading to more efficient and accurate diagnoses.AI advancements of medical imaging not only address existing unsolved problems but also present new and complex challenges. Solutions to these challenges can improve image quality and reveal new information currently obscured by noise, artifacts, or other signals. Holistic insight is the key to solving these challenges. Such insight may lead to a creative solution only when it is based on a thorough understanding of existing methods and unmet demands.This book focuses on advanced topics in medical imagingmodalities, including CT and ultrasound, with the aim of providing practical applications in the healthcare industry. It strikes a balance between mathematical theory, numerical practice, and clinical applications, offering comprehensive coverage from basic to advanced levels of mathematical theories, deep learning techniques, and algorithm implementation details. Moreover, it provides in-depth insights into the latest advancements in dental cone-beam CT, fetal ultrasound, and bioimpedance, making it an essential resource for professionals seeking to stay up-to-date with the latest developments in the field of medical imaging.

This book contains the proceedings of the 17th European Conference on Mathematics for Industry, ECMI2012, held in Lund, Sweden, July 2012, at which ECMI celebrated its 25th anniversary. It covers mathematics in a wide range of applications and methods, from circuit and electromagnetic devices, environment, fibers, flow, medicine, robotics and automotive industry, further applications to methods and education.The book includes contributions from leading figures in business, science and academia that promote the application of mathematics to industry and emphasize industrial sectors that offer the most exciting opportunities. The contributions reinforce the role of mathematics as being a catalyst for innovation as well as an overarching resource for industry and business.The book features an accessible presentation of real-world problems in industry and finance, provides insight and tools for engineers and scientists who will help them to solve similar problems and offers modeling and simulation techniques that will provide mathematicians with a source of fresh ideas and inspiration.

Various challenges concerning the production workflow are discussed in detail.The thirteen chapters of this joint work, authored by international experts from academic and industrial institutions, include survey papers of expository character as well as original research articles.

ECMI was founded in 1986 in to foster research and education in Mathematics in Industry in Europe order and these biannual conferences are the show case for ECMI's research.

As well as highlighting potentially useful applications for network analysis, this volume identifies new targets for mathematical research that promise to provide insights into network systems theory as well as facilitating the cross-fertilization of ideas between sectors.

ECMI, the European Consortium for Mathematics in Industry, is the European brand associated with applied mathematics for industry and organizes highly successful biannual conferences.

As well as highlighting potentially useful applications for network analysis, this volume identifies new targets for mathematical research that promise to provide insights into network systems theory as well as facilitating the cross-fertilization of ideas between sectors.

ECMI was founded in 1986 in to foster research and education in Mathematics in Industry in Europe order and these biannual conferences are the show case for ECMI's research.

ECMI has a brand name in Industrial Mathematics and organises successful biannual conferences. This time, the conference on Industrial Mathematics held in Eindhoven in June 2004 Mathematics focused on Aerospace, Electronic Industry, Chemical Technology, Life Sciences, Materials, Geophysics, Financial Mathematics and Water flow.

Various challenges concerning the production workflow are discussed in detail.The thirteen chapters of this joint work, authored by international experts from academic and industrial institutions, include survey papers of expository character as well as original research articles.

This book presents mathematical models that arise in current photographic science. It then proceeds to develop a mathematical model, using mathematical tools such as ordinary differential equations, partial differential equations, and stochastic processes.

This volume provides a unique collection of mathematical tools and industrial case studies in digital manufacturing. It addresses various topics, ranging from models of single production technologies, production lines, logistics and workflows to models and optimization strategies for energy consumption in production. The digital factory represents a network of digital models and simulation and 3D visualization methods for the holistic planning, realization, control and ongoing improvement of all factory processes related to a specific product. In the past ten years, all industrialized countries have launched initiatives to realize this vision, sometimes also referred to as Industry 4.0 (in Europe) or Smart Manufacturing (in the United States). Its main goals are . reconfigurable, adaptive and evolving factories capable of small-scale production . high-performance production, combining flexibility, productivity, precision and zero defects . energy and resource efficiency in manufacturing None of these goals can be achieved without a thorough modeling of all aspects of manufacturing together with a multi-scale simulation and optimization of process chains; in other words, without mathematics. To foster collaboration between mathematics and industry in this area the European Consortium for Mathematics in Industry (ECMI) founded a special interest group on Math for the Digital Factory (M4DiFa). This book compiles a selection of review papers from the M4DiFa kick-off meeting held at the Weierstrass Institute for Applied Analysis and Stochastics in Berlin, Germany, in May 2014. The workshop aimed at bringing together mathematicians working on modeling, simulation and optimization with researchers and practitioners from the manufacturing industry to develop a holistic mathematical view on digital manufacturing. This book is of interest to practitioners from industry who want to learn about important mathematical concepts, as well as to scientists who want to find out about an exciting new area of application that is of vital importance for today's highly industrialized and high-wage countries.

This book deals with mathematical problems arising in the context of meteorological modelling. It gathers and presents some of the most interesting and important issues from the interaction of mathematics and meteorology. It is unique in that it features contributions on topics like data assimilation, ensemble prediction, numerical methods, and transport modelling, from both mathematical and meteorological perspectives.The derivation and solution of all kinds of numerical prediction models require the application of results from various mathematical fields. The present volume is divided into three parts, moving from mathematical and numerical problems through air quality modelling, to advanced applications in data assimilation and probabilistic forecasting. The book arose from the workshop ¿Mathematical Problems in Meteorological Modelling¿ held in Budapest in May 2014 and organized by the ECMI Special Interest Group on Numerical Weather Prediction. Its main objective is to highlight the beauty of the development fields discussed, to demonstrate their mathematical complexity and, more importantly, to encourage mathematicians to contribute to the further success of such practical applications as weather forecasting and climate change projections. Written by leading experts in the field, the book provides an attractive and diverse introduction to areas in which mathematicians and modellers from the meteorological community can cooperate and help each other solve the problems that operational weather centres face, now and in the near future.Readers engaged in meteorological research will become more familiar with the corresponding mathematical background, while mathematicians working in numerical analysis, partial differential equations, or stochastic analysis will be introduced to further application fields of their research area, and will find stimulation and motivation for their future research work.

Proceedings from the 14th European Conference for Mathematics in Industry held in Madrid present innovative numerical and mathematical techniques. In addition, the conference also delved into education in industrial mathematics and web learning.

The idea for this book originated during the workshop "Model order reduction, coupled problems and optimization" held at the Lorentz Center in Leiden from S- tember 19-23, 2005.

This book describes the computational challenges posed by the progression toward nanoscale electronic devices and increasingly short design cycles in the microelectronics industry, and proposes methods of model reduction which facilitate circuit and device simulation for specific tasks in the design cycle.The goal is to develop and compare methods for system reduction in the design of high dimensional nanoelectronic ICs, and to test these methods in the practice of semiconductor development. Six chapters describe the challenges for numerical simulation of nanoelectronic circuits and suggest model reduction methods for constituting equations. These include linear and nonlinear differential equations tailored to circuit equations and drift diffusion equations for semiconductor devices. The performance of these methods is illustrated with numerical experiments using real-world data. Readers will benefit from an up-to-date overview of the latest model reduction methods in computational nanoelectronics.

The series of SCEE conferences aims at addressing mathematical problems which have a relevance to industry, with an emphasis on modeling and numerical simulation of electronic circuits, electromagnetic fields but also coupled problems and general mathematical and computational methods.

This book is a collection of papers presented at the last Scientific Computing in Electrical Engineering (SCEE) Conference, held in Sicily, in 2004. The series of SCEE conferences aims at addressing mathematical problems which have a relevancy to industry.

ECMI, the European Consortium for Mathematics in Industry, is the European brand associated with applied mathematics for industry and organizes highly successful biannual conferences.

Realizing the need of interaction between universities and research groups in industry, the European Consortium for Mathematics in Industry (ECMI) was founded in 1986 by mathematicians from ten European universities.

Realizing the need of interaction between universities and research groups in industry, the European Consortium for Mathematics in Industry (ECMI) was founded in 1986 by mathematicians from ten European universities.

The idea for this book originated during the workshop "Model order reduction, coupled problems and optimization" held at the Lorentz Center in Leiden from S- tember 19-23, 2005.

Polymers are substances made of macromolecules formed by thousands of atoms organized in one (homopolymers) or more (copolymers) groups that repeat themselves to form linear or branched chains, or lattice structures.

Designs in nanoelectronics often lead to challenging simulation problems and include strong feedback couplings. Industry demands provisions for variability in order to guarantee quality and yield. It also requires the incorporation of higher abstraction levels to allow for system simulation in order to shorten the design cycles, while at the same time preserving accuracy. The methods developed here promote a methodology for circuit-and-system-level modelling and simulation based on best practice rules, which are used to deal with coupled electromagnetic field-circuit-heat problems, as well as coupled electro-thermal-stress problems that emerge in nanoelectronic designs. This book covers: (1) advanced monolithic/multirate/co-simulation techniques, which are combined with envelope/wavelet approaches to create efficient and robust simulation techniques for strongly coupled systems that exploit the different dynamics of sub-systems within multiphysics problems, and which allow designers to predict reliability and ageing; (2) new generalized techniques in Uncertainty Quantification (UQ) for coupled problems to include a variability capability such that robust design and optimization, worst case analysis, and yield estimation with tiny failure probabilities are possible (including large deviations like 6-sigma); (3) enhanced sparse, parametric Model Order Reduction techniques with a posteriori error estimation for coupled problems and for UQ to reduce the complexity of the sub-systems while ensuring that the operational and coupling parameters can still be varied and that the reduced models offer higher abstraction levels that can be efficiently simulated. All the new algorithms produced were implemented, transferred and tested by the EDA vendor MAGWEL. Validation was conducted on industrial designs provided by end-users from the semiconductor industry, who shared their feedback, contributed to the measurements, and supplied both material data and process data. In closing, a thorough comparison to measurements on real devices was made in order to demonstrate the algorithms' industrial applicability.

This book describes the computational challenges posed by the progression toward nanoscale electronic devices and increasingly short design cycles in the microelectronics industry, and proposes methods of model reduction which facilitate circuit and device simulation for specific tasks in the design cycle.The goal is to develop and compare methods for system reduction in the design of high dimensional nanoelectronic ICs, and to test these methods in the practice of semiconductor development. Six chapters describe the challenges for numerical simulation of nanoelectronic circuits and suggest model reduction methods for constituting equations. These include linear and nonlinear differential equations tailored to circuit equations and drift diffusion equations for semiconductor devices. The performance of these methods is illustrated with numerical experiments using real-world data. Readers will benefit from an up-to-date overview of the latest model reduction methods in computational nanoelectronics.

This volume gives a survey on mathematical and computational methods in image registration. During the last year sophisticated numerical models for registration and efficient numerical methods have been proposed. The book also summarizes the state-of-the-art in mathematical and computational methods in image registration.

The fourth international conference on Scientific Computing in Electrical En­ gineering (SCEE) was held at the Eindhoven University of Technology, from 23rd to 28th June, 2002. It was sponsored by Philips Research Laborato­ ries Eindhoven, the Eindhoven University of Technology, Computer Simula­ tion Technology (CST) from Darmstadt, ABB Corporate Research, Thales Netherlands,the European Consortium for Mathematics in Industry (ECMI), the University of Rostock (organiser of SCEE-2000), the European network for Mathematics, Computing and Simulation for Industry (MACSI-net), the Royal Netherlands Academy of Arts and Sciences (KNAW), and the Scien­ tific Computing Group of the Eindhoven University of Technology. The Program Committee consisted of: Dr. Alain Bossavit, Electricite de France, Clamart, France. Dr. Uwe Feldmann, Infineon Technologies A.G., Munich, Germany. Prof.Dr. Leszek Demkowicz, University of Texas at Austin, USA. Dr. Michael Gunther, Universitat Karlsruhe, Germany. Prof.Dr. Ulrich Langer, Johannes Kepler Universitat, Linz, Austria. Dr. Jan ter Maten,Philips Research Laboratories Eindhoven, The Nether­ lands. Prof.Dr. Ursula van Rienen, Universitat Rostock, Germany. Prof.Dr. Jaijeet Roychowdhury, University of Minnesota, USA. - Prof.Dr. Wil Schilders, Technische Universiteit Eindhoven and Philips Research Laboratories Eindhoven, The Netherlands. - Prof.Dr. Thomas Weiland, Technische Universitat Darmstadt, Germany.