Bücher von Cher Ming (Ntu Tan - tales-buecher.de

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Electromigration In Ulsi Interconnections

von Cher Ming (Ntu Tan

116,00 €

Presents a description of the electro migration in integrated circuits. This book examines the various interconnected systems and their evolution employed in integrated circuit technology. It is suitable for readers on electro migration in ULSI interconnections.
- Buch
- 116,00 €
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