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Advanced Test Methods for SRAMs

- Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

von Alberto Bosio, Luigi Dilillo, Patrick Girard, usw.

94,00 €

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here.
- Buch
- 94,00 €
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