Name: From Contamination to Defects, Faults and Yield Loss
Price: 98.00 EUR
Availability: InStock
Author: Jitendra B. Khare
ISBN: 9780792397144

From Contamination to Defects, Faults and Yield Loss von Jitendra B. Khare

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Über From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

Sprache:
Englisch

ISBN:
9780792397144

Verlag:
Springer

Einband:
Gebundene Ausgabe

Seitenzahl:
150

Veröffentlicht:
1. April 1996

Ausgabe:
1996

Abmessungen:
234x156x11 mm.

Gewicht:
930 g.

98,00 € inkl. MwSt.
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Beschreibung von From Contamination to Defects, Faults and Yield Loss

Given such a high level of investment, it is critical for IC manufacturers to reduce manufacturing costs and get a better return on their investment. The most obvious method of reducing the manufacturing cost per die is to improve manufacturing yield.

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Das Buch From Contamination to Defects, Faults and Yield Loss ist in den folgenden Kategorien erhältlich:

Wirtschaft & Schule

From Contamination to Defects, Faults and Yield Loss

Über Jitendra B. Khare

Beschreibung von From Contamination to Defects, Faults and Yield Loss

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