Name: Theoretical Concepts of X-Ray Nanoscale Analysis
Price: 131.00 EUR
Availability: InStock
Author: Ilya Feranchuk
ISBN: 9783642381768

Theoretical Concepts of X-Ray Nanoscale Analysis von Ilya Feranchuk

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Über Theoretical Concepts of X-Ray Nanoscale Analysis

The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.

Sprache:
Englisch

ISBN:
9783642381768

Verlag:
Springer-Verlag Berlin and Heidelberg GmbH & Co. KG

Einband:
Gebundene Ausgabe

Seitenzahl:
318

Veröffentlicht:
7. September 2013

Ausgabe:
2014

Abmessungen:
235x155x23 mm.

Gewicht:
664 g.

131,00 € inkl. MwSt.
~~149,79 €~~ UVP

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Beschreibung von Theoretical Concepts of X-Ray Nanoscale Analysis

The principle features of the book are: basics of X-ray scattering, interaction between X-rays and matter and new theoretical concepts of X-ray scattering. The various X-ray techniques are considered in detail: high-resolution X-ray diffraction, X-ray reflectivity, grazing-incidence small-angle X-ray scattering and X-ray residual stress analysis.

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Das Buch Theoretical Concepts of X-Ray Nanoscale Analysis ist in den folgenden Kategorien erhältlich:

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Theoretical Concepts of X-Ray Nanoscale Analysis

Über Ilya Feranchuk

Beschreibung von Theoretical Concepts of X-Ray Nanoscale Analysis

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