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Gate-Controlled Diodes simulations for light sensors design

Gate-Controlled Diodes simulations for light sensors designvon Hugo Puertas de Araújo Sie sparen 18% des UVP sparen 18%
Über Gate-Controlled Diodes simulations for light sensors design

This book is the result of the research activities carried out at the Polytechnic School of the University of São Paulo to obtain an MSc. degree in Electrical Engineering. The objective of the work was to verify the ability of Gate-Controlled Diodes to respond selectively to the light¿s wavelength, being able then to work as color sensors. The key idea is to drive such devices into deep depletion operation conditions in order to increase its depletion region beyond its maximum width. Computer simulations were used to characterize the device¿s electrical behavior and also to investigate the absorption of light with different wavelengths at a PN junction. Also, some electrical characterization of test-structures was carried out in order to verify the fabrication processes used to manufacture Gate-Controlled Diodes.

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  • Sprache:
  • Englisch
  • ISBN:
  • 9786202923163
  • Einband:
  • Taschenbuch
  • Seitenzahl:
  • 140
  • Veröffentlicht:
  • 5. November 2020
  • Abmessungen:
  • 150x9x220 mm.
  • Gewicht:
  • 227 g.
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Beschreibung von Gate-Controlled Diodes simulations for light sensors design

This book is the result of the research activities carried out at the Polytechnic School of the University of São Paulo to obtain an MSc. degree in Electrical Engineering. The objective of the work was to verify the ability of Gate-Controlled Diodes to respond selectively to the light¿s wavelength, being able then to work as color sensors. The key idea is to drive such devices into deep depletion operation conditions in order to increase its depletion region beyond its maximum width. Computer simulations were used to characterize the device¿s electrical behavior and also to investigate the absorption of light with different wavelengths at a PN junction. Also, some electrical characterization of test-structures was carried out in order to verify the fabrication processes used to manufacture Gate-Controlled Diodes.

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