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Spectroscopic Ellipsometry for Photovoltaics

- Volume 1: Fundamental Principles and Solar Cell Characterization

Über Spectroscopic Ellipsometry for Photovoltaics

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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  • Sprache:
  • Englisch
  • ISBN:
  • 9783319753751
  • Einband:
  • Gebundene Ausgabe
  • Seitenzahl:
  • 594
  • Veröffentlicht:
  • 24. Januar 2019
  • Ausgabe:
  • 12018
  • Abmessungen:
  • 165x243x36 mm.
  • Gewicht:
  • 1058 g.
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Beschreibung von Spectroscopic Ellipsometry for Photovoltaics

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community.
The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.

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